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Jihun Jung
ORCID
Publication Activity (10 Years)
Years Active: 2008-2020
Publications (10 Years): 11
Top Topics
Integrated Circuit
Wordnet
Error Resilience
Semiconductor Devices
Top Venues
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
ICIP
CoRR
ITSC
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Publications
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Jinuk Kim
,
Muhammad Ibtesam
,
Dooyoung Kim
,
Jihun Jung
,
Sungju Park
CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience.
IEEE Access
8 (2020)
Soon Kwon
,
Jaehyeong Park
,
Heechul Jung
,
Jihun Jung
,
Min-Kook Choi
,
Iman Rahmansyah Tayibnapis
,
Jin-Hee Lee
,
Woong-Jae Won
,
Sung-Hoon Youn
,
Kwang-Hoe Kim
,
Tae Hun Kim
Framework for Evaluating Vision-based Autonomous Steering Control Model.
ITSC
(2018)
Muhammad Adil Ansari
,
Jihun Jung
,
Dooyoung Kim
,
Sungju Park
Time-Multiplexed 1687-Network for Test Cost Reduction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
37 (8) (2018)
Muhammad Adil Ansari
,
Jihun Jung
,
Dooyoung Kim
,
Sungju Park
Erratum to "Time-Multiplexed-Network for Test Cost Reduction".
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
37 (9) (2018)
Min-Kook Choi
,
Jaehyeong Park
,
Jihun Jung
,
Heechul Jung
,
Jin-Hee Lee
,
Woong-Jae Won
,
Woo Young Jung
,
Jincheol Kim
,
Soon Kwon
Co-occurrence matrix analysis-based semi-supervised training for object detection.
CoRR
(2018)
Min-Kook Choi
,
Jaehyeong Park
,
Jihun Jung
,
Heechul Jung
,
Jin-Hee Lee
,
Woong-Jae Won
,
Woo Young Jung
,
Jincheol Kim
,
Soon Kwon
Co-Occurrence Matrix Analysis-Based Semi-Supervised Training for Object Detection.
ICIP
(2018)
Heechul Jung
,
Min-Kook Choi
,
Jihun Jung
,
Jin-Hee Lee
,
Soon Kwon
,
Woo Young Jung
ResNet-Based Vehicle Classification and Localization in Traffic Surveillance Systems.
CVPR Workshops
(2017)
Jihun Jung
,
Muhammad Adil Ansari
,
Dooyoung Kim
,
Hyunbean Yi
,
Sungju Park
On Diagnosing the Aging Level of Automotive Semiconductor Devices.
IEEE Trans. Circuits Syst. II Express Briefs
(7) (2017)
Muhammad Adil Ansari
,
Jihun Jung
,
Dooyoung Kim
,
Sungju Park
Time-multiplexed test access architecture for stacked integrated circuits.
IEICE Electron. Express
13 (14) (2016)
Jihun Jung
,
Muhammad Adil Ansari
,
Dooyoung Kim
,
Hyunbean Yi
,
Sungju Park
Efficient diagnosis technique for aging defects on automotive semiconductor chips.
ETS
(2015)
Dooyoung Kim
,
Muhammad Adil Ansari
,
Jihun Jung
,
Sungju Park
Scan-Puf: Puf Elements Selection Methods for Viable IC Identification.
ATS
(2015)
Umair Ishaq
,
Jihun Jung
,
Jaehoon Song
,
Sungju Park
Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate.
Asian Test Symposium
(2011)
Jihun Jung
,
Mohammad Abaii
,
Rahim Tafazolli
Load Matrix Optimization in Mobile Cellular Networks.
VTC Spring
(2008)