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Time-multiplexed test access architecture for stacked integrated circuits.
Muhammad Adil Ansari
Jihun Jung
Dooyoung Kim
Sungju Park
Published in:
IEICE Electron. Express (2016)
Keyphrases
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integrated circuit
built in self test
real time
low cost
electron beam
management system
software architecture
associative memory
access control
test cases
structured light
network architecture
random access
printed circuit boards