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Efficient diagnosis technique for aging defects on automotive semiconductor chips.

Jihun JungMuhammad Adil AnsariDooyoung KimHyunbean YiSungju Park
Published in: ETS (2015)
Keyphrases
  • high speed
  • database
  • fault diagnosis
  • neural network
  • genetic algorithm
  • artificial intelligence
  • cost effective
  • defect detection
  • multiple faults