Scan-Puf: Puf Elements Selection Methods for Viable IC Identification.
Dooyoung KimMuhammad Adil AnsariJihun JungSungju ParkPublished in: ATS (2015)
Keyphrases
- significant improvement
- real world
- computational cost
- benchmark datasets
- empirical studies
- qualitative and quantitative
- electronic devices
- neural network
- information systems
- knowledge base
- reinforcement learning
- preprocessing
- statistical models
- machine learning methods
- computationally expensive
- optimization methods