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On Diagnosing the Aging Level of Automotive Semiconductor Devices.
Jihun Jung
Muhammad Adil Ansari
Dooyoung Kim
Hyunbean Yi
Sungju Park
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2017)
Keyphrases
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semiconductor devices
higher level
levels of abstraction
neural network
learning algorithm
case study
lower level