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A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains.
Hyunbean Yi
Sandip Kundu
Sangwook Cho
Sungju Park
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2010)
Keyphrases
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design process
case study
real time
artificial intelligence
high speed
building blocks
design methodology
scan data
real world
application domains
parallel algorithm
cross domain
design issues
layout design