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Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults.
Jaehoon Song
Juhee Han
Hyunbean Yi
Taejin Jung
Sungju Park
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2009)
Keyphrases
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test cases
fault diagnosis
high speed
root cause
genetic algorithm
fault detection
real time
pattern discovery
built in self test
data mining
information systems
statistical tests
temporal patterns
statistical significance