Login / Signup
Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress.
Jongsun Bae
Sanghyeon Baeg
Sungju Park
Published in:
IEEE Trans. Instrum. Meas. (2012)
Keyphrases
</>
random access memory
low voltage
power system
design considerations
power consumption
positive and negative
data transmission
low power
visual cortex
power management
high voltage
neural network
artificial neural networks
wireless sensor networks
power supply
leakage current