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Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators.
Muhammad Ibtesam
Umair Saeed Solangi
Jinuk Kim
Muhammad Adil Ansari
Sungju Park
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2022)
Keyphrases
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cost reduction
bayesian networks
search space
test cases