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Parity bit calculation and test signal compaction for BIST applications.
Sungju Park
Sheldon B. Akers
Published in:
J. Electron. Test. (1992)
Keyphrases
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signal processing
built in self test
error correction
frequency domain
case study
non stationary
test data
statistical tests
signal detection
genetic algorithm
information systems
digital images
high speed
pattern matching
integrated circuit