Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices.
Soonyoung LeeIlgon KimSungmock HaCheong-sik YuJinhyun NohSangwoo PaeJongwoo ParkPublished in: IRPS (2015)
Keyphrases
- error rate
- test set
- x ray
- mobile devices
- infrared
- power consumption
- lower error rates
- dynamic random access memory
- misclassification rate
- power reduction
- cmos technology
- leakage current
- low power
- rule sets
- cost sensitive classification
- rejection rate
- smart phones
- word error rate
- equal error rate
- learning algorithm
- estimation error
- training set