Richard Wong

Publication Activity (10 Years)

Years Active: 1998-2023
Publications (10 Years): 7

Top Topics

Gigabit Ethernet

Content Addressable

Top Venues

J. Electron. Test.

Microelectron. Reliab.

EURASIP J. Wirel. Commun. Netw.

Publications

Hyunjin You, Doochan Ko, Daniel Kim, Richard Wong, Inwhee Joe
Dynamic access control method for SDP-based network environments. EURASIP J. Wirel. Commun. Netw. 2023 (1) (2023)
Mohammad Kazem Chamran, Kok-Lim Alvin Yau, Rafidah Md. Noor, Richard Wong
A Distributed Testbed for 5G Scenarios: An Experimental Study. Sensors 20 (1) (2020)
Somnath Kundu, Muqing Liu, Shi-Jie Wen, Richard Wong, Chris H. Kim
A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer. IEEE J. Solid State Circuits 54 (1) (2019)
Somnath Kundu, Muqing Liu, Richard Wong, Shi-Jie Wen, Chris H. Kim
A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning. ISSCC (2018)
Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87 (2018)
Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. Microelectron. Reliab. 80 (2018)
Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS (2017)
GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. IRPS (2015)
Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30 (6) (2014)
Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J. Electron. Test. 30 (1) (2014)
Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication. Microprocess. Microsystems 37 (8-D) (2013)
Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. J. Electron. Test. 29 (4) (2013)
Richard Wong, Rita Fung, Shi-Jie Wen
Networking industry trends in ESD protection for high speed IOs. ASICON (2013)
Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. J. Electron. Test. 28 (6) (2012)
David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong
Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. (8) (2012)
Jian Liu, Xin Wang, Hui Zhao, Qiang Fang, Albert Z. Wang, Lin Lin, He Tang, Siqiang Fan, Bin Zhao, Shi-Jie Wen, Richard Wong
Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS. IEEE J. Solid State Circuits 46 (5) (2011)
Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. ISQED (2011)
Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Mitigating the effects of large multiple cell upsets (MCUs) in memories. ACM Trans. Design Autom. Electr. Syst. 16 (4) (2011)
Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. Circuits Syst. I Regul. Pap. (4) (2010)
Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS (2008)
Richard Wong, Rodney W. Topor, Hong Shen
A parallel sort-balance mutual range-join algorithm on hypercube computers. Microprocess. Microsystems 22 (3-4) (1998)