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Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node.

Damien LeroyRémi GaillardErwin SchäferCyrille BeltrandoShi-Jie WenRichard Wong
Published in: IOLTS (2008)
Keyphrases
  • error rate
  • test set
  • misclassification rate
  • rule sets
  • equal error rate
  • lower error rates
  • power consumption
  • low power
  • estimation error
  • support vector
  • data transmission
  • cmos technology
  • word error rate