Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.
Yuanqing LiLi ChenIssam NofalMo ChenHaibin WangRui LiuQingyu ChenMilos KrsticShuting ShiGang GuoSang H. BaegShi-Jie WenRichard WongPublished in: Microelectron. Reliab. (2018)