Donghyuk Yun

Publication Activity (10 Years)

Years Active: 2016-2021
Publications (10 Years): 5

Top Topics

Statistical Distribution

Top Venues

Microelectron. Reliab.

Publications

Donghyuk Yun, Myungsang Park, GeunYong Bak, Sanghyeon Baeg, Shi-Jie Wen
Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation. IEEE Access 9 (2021)
Donghyuk Yun, Myungsang Park, Chul Seung Lim, Sanghyeon Baeg
Study of TID effects on one row hammering using gamma in DDR4 SDRAMs. IRPS (2018)
Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. Microelectron. Reliab. 80 (2018)
Kyungbae Park, Chul Seung Lim, Donghyuk Yun, Sanghyeon Baeg
Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3 × nm technology. Microelectron. Reliab. 57 (2016)
Kyungbae Park, Donghyuk Yun, Sanghyeon Baeg
Statistical distributions of row-hammering induced failures in DDR3 components. Microelectron. Reliab. 67 (2016)