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Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3 × nm technology.
Kyungbae Park
Chul Seung Lim
Donghyuk Yun
Sanghyeon Baeg
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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root cause analysis
nm technology
root cause
decision support
power consumption
fault diagnosis
fault detection
low power
decision support system
pattern recognition
information technology
object oriented
neural network
decision making
artificial intelligence
log records
machine learning