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SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET.
Taiki Uemura
Soonyoung Lee
Dahye Min
Ihlhwa Moon
Seungbae Lee
Sangwoo Pae
Published in:
IRPS (2019)
Keyphrases
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event detection
steady state
image processing