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Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems.

Nicholas J. PieperM. ChunYoni XiongH. M. DattiloJenna B. KronenbergSanghyeon BaegShi-Jie WenRita FungD. ChanC. EscobarBharat L. Bhuva
Published in: IRPS (2024)
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