VISUAL INSPECTION
Experts
- Juha Hyyppä
- Karl Rohr
- Jonathan Li
- Edward J. Delp
- Antero Kukko
- Cheng Wang
- Harri Kaartinen
- Norbert Pfeifer
- Markus Holopainen
- Joel H. Saltz
- Mikko Vastaranta
- Paul Salama
- Kenneth W. Dunn
- Roland Eils
- Xiaowei Yu
- Jun Kong
- Hannu Hyyppä
- Metin N. Gurcan
- Erik Meijering
- Toshio Fukuda
- Anttoni Jaakkola
- Xinlian Liang
- Wiro J. Niessen
- Francisco Bonnín-Pascual
- J. Alison Noble
- Roland Siegwart
- Alberto Ortiz
- William J. Godinez
- Yi Lin
- Piotr Boniecki
- Andreas K. Maier
- George Nikolakopoulos
- Nathalie Harder
- Zhen Dong
- Bisheng Yang
- Ralf Bartenschlager
- George Teodoro
- Chichen Fu
- Erik Næsset
Venues
- CoRR
- Remote. Sens.
- Sensors
- ISBI
- IGARSS
- ICRA
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Medical Imaging: Image Processing
- EMBC
- IROS
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Appl. Earth Obs. Geoinformation
- Microelectron. Reliab.
- IEEE Trans. Medical Imaging
- ICIP
- Pattern Recognit.
- IEEE Trans. Biomed. Eng.
- Multim. Tools Appl.
- Medical Image Anal.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Geosci. Remote. Sens. Lett.
- Pattern Recognit. Lett.
- ICPR
- Medical Imaging: Image-Guided Procedures
- MVA
- Mach. Vis. Appl.
- ICASSP
- Bildverarbeitung für die Medizin
- DAC
- Comput. Electron. Agric.
- Comput. Methods Programs Biomed.
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Medical Imaging: Computer-Aided Diagnosis
- ROBIO
- CIARP
- Expert Syst. Appl.
- MICCAI (2)
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