Signal characteristic and test exploitation for intermittent nanometer-scale cracks.

Hosung Lee Sanghyeon Baeg

Published in: Microelectron. Reliab. (2018)

Keyphrases

test data
digital images
frequency domain
signal processing
scale space
high frequency
neural network
information retrieval
statistical significance
databases
image processing
website
pattern recognition
multiresolution
single channel
slowly varying