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A cost-effective design for testability: clock line control and test generation using selective clocking.
Sanghyeon Baeg
William A. Rogers
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
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cost effective
cost effectiveness
test generation
design automation
low cost
circuit design
design process
software testing
test cases
case study
database systems
training data
user interface