Fault Coverage Re-Evaluation of Memory Test Algorithms With Physical Memory Characteristics.
Kiseok LeeJeonghwan KimSanghyeon BaegPublished in: IEEE Access (2021)
Keyphrases
- memory requirements
- memory usage
- memory footprint
- optimization problems
- computational complexity
- test data
- significant improvement
- evaluation metrics
- recently developed
- main memory
- cache conscious
- real world
- post hoc
- external memory
- image processing algorithms
- orders of magnitude
- computationally efficient
- computational cost
- data structure
- machine learning
- computational efficiency
- machine learning algorithms
- computational power
- nearest neighbor
- data mining