A New Test Generation Methodology Using Selective Clocking for the Clock Line Controlled Circuits.
Sanghyeon BaegWilliam A. RogersPublished in: ICCD (1994)
Keyphrases
- test generation
- circuit design
- high speed
- design automation
- test cases
- symbolic execution
- test sequences
- static analysis
- line segments
- mutation testing
- quality assurance
- software testing
- power dissipation
- data sets
- power consumption
- regression testing
- design methodology
- monitoring system
- knowledge management
- open source
- real world