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Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits.

Haibin WangMulong LiXixi DaiShuting ShiLi ChenGang Guo
Published in: J. Electron. Test. (2016)
Keyphrases
  • logic circuits
  • event detection
  • low power
  • signal processing
  • real time
  • image processing
  • data model
  • input output
  • fault tolerant
  • functional decomposition
  • tunnel diode