Login / Signup

Radiation Tolerant SRAM Cell Design in 65nm Technology.

JianAn WangXue WuHaonan TianLixiang LiShuting ShiLi Chen
Published in: J. Electron. Test. (2021)
Keyphrases
  • nm technology
  • power consumption
  • neural network
  • engineering design
  • design process
  • computer aided
  • case study
  • user interface
  • low power
  • design considerations