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Radiation Tolerant SRAM Cell Design in 65nm Technology.
JianAn Wang
Xue Wu
Haonan Tian
Lixiang Li
Shuting Shi
Li Chen
Published in:
J. Electron. Test. (2021)
Keyphrases
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nm technology
power consumption
neural network
engineering design
design process
computer aided
case study
user interface
low power
design considerations