Christopher Frost

Publication Activity (10 Years)

Years Active: 2012-2021
Publications (10 Years): 5

Top Topics

Experimental Findings

Safety Critical

Computing Devices

Top Venues

Publications

Fernando Fernandes dos Santos, Sujit Malde, Carlo Cazzaniga, Christopher Frost, Luigi Carro, Paolo Rech
Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs. CoRR (2021)
Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Andrea Favalli, Opale Schappert, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Paolo Rech
Thermal neutrons: a possible threat for supercomputer reliability. J. Supercomput. 77 (2) (2021)
Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech
Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications. ETS (2020)
Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. IRPS (2020)
Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fermando Santos, Gabriel Piscoya Dávila, Philippe Olivier Alexandre Navaux, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech
An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices. DSN (Supplements) (2020)
Lucas A. Tambara, Felipe Almeida, Paolo Rech, Fernanda Lima Kastensmidt, Giovanni Bruni, Christopher Frost
Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects. ARC (2015)
Paolo Rech, Christopher Frost, Luigi Carro
GPUs Neutron Sensitivity Dependence on Data Type. J. Electron. Test. 30 (3) (2014)
Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs. Microelectron. Reliab. 54 (9-10) (2014)
Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Christopher Frost
Decreasing FIT with diverse triple modular redundancy in SRAM-based FPGAs. DFT (2014)
Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost
Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs. ETS (2014)
Paolo Rech, Caroline Aguiar, Christopher Frost, Luigi Carro
Experimental evaluation of thread distribution effects on multiple output errors in GPUs. ETS (2013)
Paolo Rech, Caroline Aguiar, Christopher Frost, Luigi Carro
Neutron sensitivity of integer and floating point operations executed in GPUs. LATW (2013)
Paolo Rech, Caroline Aguiar, Ronaldo Rodrigues Ferreira, Christopher Frost, Luigi Carro
Neutron radiation test of graphic processing units. IOLTS (2012)