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Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs.

Fernanda Lima KastensmidtJorge L. TonfatThiago Hanna BothPaolo RechGilson I. WirthRicardo ReisFlorent BruguierPascal BenoitLionel TorresChristopher Frost
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • error rate
  • test set
  • power consumption
  • lower error rates
  • false discovery rate
  • power system
  • low voltage
  • misclassification rate
  • objective function
  • active learning
  • language model
  • information theoretic
  • rejection rate