Gilson I. Wirth

Publication Activity (10 Years)

Years Active: 2000-2023
Publications (10 Years): 9

Top Topics

Silicon Nitride

Top Venues

Microelectron. Reliab.

J. Electron. Test.

Microelectron. J.

Publications

Maurício Banaszeski da Silva, Gilson I. Wirth, Hans P. Tuinhout, Adrie Zegers-van Duijnhoven, Andries J. Scholten
Random Telegraph Noise in Analog CMOS Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 70 (6) (2023)
Gilson I. Wirth
Modeling and Simulation of Charge Trapping in 1/f Noise, RTN and BTI: from Devices to Circuits. MIXDES (2021)
Pablo Ilha Vaz, Gilson I. Wirth, Fábio Fedrizzi Vidor, Thiago Hanna Both
TID effects on I-V characteristics of bulk CMOS STD and ELT-based devices in 600 nm. Microelectron. J. 97 (2020)
Pablo Ilha Vaz, Thiago Hanna Both, Fábio Fedrizzi Vidor, Raphael Martins Brum, Gilson I. Wirth
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library. J. Electron. Test. 34 (6) (2018)
Alexandre Simionovski, Gilson I. Wirth, Ronald D. Schrimpf, Bharat L. Bhuva
A TCAD evaluation of a single Bulk-BICS with integrative memory cell. Microelectron. J. 80 (2018)
Thales E. Becker, Fábio Fedrizzi Vidor, Gilson I. Wirth, Thorsten Meyers, Julia Reker, Ulrich Hilleringmann
Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. LATS (2018)
Fábio Fedrizzi Vidor, Gilson I. Wirth, Thorsten Meyers, Julia Reker, Ulrich Hilleringmann
Self-aligned ZnO nanoparticle-based TFTs for flexible electronics. AFRICON (2017)
Raphael Martins Brum, Gilson I. Wirth
MagPDK: An open-source process design kit for circuit design with magnetic tunnel junctions. SBCCI (2016)
Peterson R. Agostinho, Odair Lelis Goncalez, Gilson I. Wirth
Rail to rail radiation hardened operational amplifier in standard CMOS technology with standard layout techniques. Microelectron. Reliab. 67 (2016)
Alexandre Simionovski, Rafael Galhardo Vaz, Odair Lelis Goncalez, Gilson I. Wirth
Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell. J. Electron. Test. 31 (4) (2015)
Alexandre Simionovski, Gilson I. Wirth
Adding a self-reset feature to the Bulk-BICS with dynamic storage cell. Microelectron. Reliab. 55 (12) (2015)
Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Luciano Ost, Ricardo Reis
Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability. ICECS (2015)
Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Fernanda Gusmão de Lima Kastensmidt, Luciano Ost, Ricardo Reis
Impact of dynamic voltage scaling and thermal factors on SRAM reliability. Microelectron. Reliab. 55 (9-10) (2015)
Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs. Microelectron. Reliab. 54 (9-10) (2014)
Vinicius V. A. Camargo, Ben Kaczer, Gilson I. Wirth, Tibor Grasser, Guido Groeseneken
Use of SSTA Tools for Evaluating BTI Impact on Combinational Circuits. IEEE Trans. Very Large Scale Integr. Syst. 22 (2) (2014)
Fábio Fedrizzi Vidor, Gilson I. Wirth, Ulrich Hilleringmann
Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics. Microelectron. Reliab. 54 (12) (2014)
Vinicius V. A. Camargo, Ben Kaczer, Tibor Grasser, Gilson I. Wirth
Circuit simulation of workload-dependent RTN and BTI based on trap kinetics. Microelectron. Reliab. 54 (11) (2014)
Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost
Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs. ETS (2014)
Dalton M. Colombo, Gilson I. Wirth, Sergio Bampi, P. Srinivasan
Voltage reference design using 1 V power supply in 0.13 µm CMOS technology. LASCAS (2013)
Gilson I. Wirth, Dragica Vasileska, N. Ashraf, Lucas Brusamarello, R. Della Giustina, P. Srinivasan
Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants. Microelectron. Reliab. 52 (12) (2012)
Miguel Miranda, Philippe Roussel, Lucas Brusamarello, Gilson I. Wirth
Statistical characterization of standard cells using design of experiments with response surface modeling. DAC (2011)
Lucas Brusamarello, Gilson I. Wirth, Philippe Roussel, Miguel Miranda
Fast and accurate statistical characterization of standard cell libraries. Microelectron. Reliab. 51 (12) (2011)
Ulrich Hilleringmann, K. Wolff, F. Assion, Fábio Fedrizzi Vidor, Gilson I. Wirth
Semiconductor nanoparticles for electronic device integration on foils. AFRICON (2011)
Maurício Banaszeski da Silva, Gilson I. Wirth
Modeling the impact of RTS on the reliability of ring oscillators. SBCCI (2010)
Thiago Assis, Fernanda Lima Kastensmidt, Gilson I. Wirth, Ricardo Reis
Measuring the effectiveness of symmetric and asymmetric transistor sizing for Single Event Transient mitigation in CMOS 90nm technologies. LATW (2009)
Christian Jesús B. Fayomi, Gilson I. Wirth, David M. Binkley, Akira Matsuzawa
An experimental 0.6-V 57.5-fJ/conversion-step 250-kS/s 8-bit rail-to-rail successive approximation ADC in 0.18µm CMOS. ICECS (2009)
Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth
Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. LATW (2009)
Maurício Banaszeski da Silva, Vinicius V. A. Camargo, Lucas Brusamarello, Gilson I. Wirth, Roberto da Silva
NBTI-aware technique for transistor sizing of high-performance CMOS gates. LATW (2009)
Gustavo Neuberger, Gilson I. Wirth, Ricardo Reis
Protecting digital circuits against hold time violation due to process variability. SBCCI (2009)
Lucas Brusamarello, Gilson I. Wirth, Roberto da Silva
Statistical RTS model for digital circuits. Microelectron. Reliab. 49 (9-11) (2009)
Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt
Modeling the sensitivity of CMOS circuits to radiation induced single event transients. Microelectron. Reliab. 48 (1) (2008)
Gilson I. Wirth
Bulk built in current sensors for single event transient detection in deep-submicron technologies. Microelectron. Reliab. 48 (5) (2008)
Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo A. L. Reis
Probabilistic Approach for Yield Analysis of Dynamic Logic Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. (8) (2008)
Christian Jesús B. Fayomi, Gilson I. Wirth, Jaime Ramírez-Angulo, Akira Matsuzawa
"The flipped voltage follower"-based low voltage fully differential CMOS sample-and-hold circuit. ISCAS (2008)
Peter Glösekötter, Ulrich Greveler, Gilson I. Wirth
Device degradation and resilient computing. ISCAS (2008)
Egas Henes Neto, Gilson I. Wirth, Fernanda Lima Kastensmidt
Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors. J. Electron. Test. 24 (5) (2008)
Lucas Brusamarello, Roberto da Silva, Ricardo A. L. Reis, Gilson I. Wirth
Yield Analysis by Error Propagation Using Numerical Derivatives Considering WD and D2D variations. ISVLSI (2007)
Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo A. L. Reis
Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level. VLSI-SoC (2007)
Carlos Arthur Lang Lisbôa, Fernanda Lima Kastensmidt, Egas Henes Neto, Gilson I. Wirth, Luigi Carro
Using built-in sensors to cope with long duration transient faults in future technologies. ITC (2007)
Egas Henes Neto, Fernanda Lima Kastensmidt, Gilson I. Wirth
A built-in current sensor for high speed soft errors detection robust to process and temperature variations. SBCCI (2007)
Gilson I. Wirth, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt
Accurate and computer efficient modelling of single event transients in CMOS circuits. IET Circuits Devices Syst. 1 (2) (2007)
Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo Augusto da Luz Reis
Técnicas probabilísticas para análise de yield em nível elétrico usando propagação de erros e derivadas numéricas. RITA 14 (2) (2007)
Gustavo Neuberger, Gilson I. Wirth, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis
Statistical Analysis of Normality of Systematic and Random Variability of Flip-Flop Race Immunity in 130nm and 90nm CMOS Technologies. VLSI-SoC (Selected Papers) (2007)
Gustavo Neuberger, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis, Gilson I. Wirth, Ralf Brederlow, Christian Pacha
Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies. VLSI-SoC (2007)
Gilson I. Wirth, Christian Fayomi
The Bulk Built In Current Sensor Approach for Single Event Transient Detection. SoC (2007)
Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo Reis
Statistical and Numerical Approach for a Computer efficient circuit yield analysis. VLSI-SoC (Selected Papers) (2007)
Dalton M. Colombo, Gilson I. Wirth, Sergio Bampi
Trim range limited by noise in bandgap voltage references. SBCCI (2007)
Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt
Generation and Propagation of Single Event Transients in CMOS Circuits. DDECS (2006)
Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt
Using Bulk Built-in Current Sensors to Detect Soft Errors. IEEE Micro 26 (5) (2006)
Gilson I. Wirth, Ivandro Ribeiro, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt
Single event transients in dynamic logic. SBCCI (2006)
Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt
Single event transients in combinatorial circuits. SBCCI (2005)
Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt
Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. SBCCI (2005)
Peter Glösekötter, Christian Pacha, Karl F. Goser, Gilson I. Wirth, Werner Prost, Uwe Auer, M. Agethen, P. Velling, Franz-Josef Tegude
Digital Circuit Design Based on the Resonant-Tunneling-Hetero-Junction-Bipolar-Transistor. SBCCI (2000)