Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors.
Thales E. BeckerFábio Fedrizzi VidorGilson I. WirthThorsten MeyersJulia RekerUlrich HilleringmannPublished in: LATS (2018)
Keyphrases
- thin film
- high density
- short circuit
- electron microscopy
- room temperature
- silicon nitride
- electrical properties
- field effect transistors
- frequency domain
- grain size
- low density
- equivalent circuit
- white light interferometry
- integrated circuit
- power consumption
- multi layer
- low power
- data center
- solar cell
- fuel cell
- film thickness
- plasma etching
- transmission line
- x ray
- data analysis
- data streams
- databases