Odair Lelis Goncalez

Publication Activity (10 Years)

Years Active: 2012-2017
Publications (10 Years): 2

Top Topics

Dynamic Random Access Memory

Thresholding Method

Top Venues

J. Electron. Test.

Microelectron. Reliab.

Publications

Carlos J. Gonzalez, Cristiano P. Chenet, Matheus Budelon, Rafael Galhardo Vaz, Odair Lelis Goncalez, Tiago R. Balen
Evaluation of a mixed-signal design diversity system under radiation effects. LATS (2017)
Peterson R. Agostinho, Odair Lelis Goncalez, Gilson I. Wirth
Rail to rail radiation hardened operational amplifier in standard CMOS technology with standard layout techniques. Microelectron. Reliab. 67 (2016)
Alexandre Simionovski, Rafael Galhardo Vaz, Odair Lelis Goncalez, Gilson I. Wirth
Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell. J. Electron. Test. 31 (4) (2015)
Evaldo Carlos Fonseca Pereira, Odair Lelis Goncalez, Rafael Galhardo Vaz, Claudio Antonio Federico, Thiago Hanna Both, Gilson Inácio Wirth
The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory. LATW (2014)
Lucas A. Tambara, Jorge L. Tonfat, Ricardo Reis, Fernanda Lima Kastensmidt, Evaldo Carlos Fonseca Pereira, Rafael Galhardo Vaz, Odair Lelis Goncalez
Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects. LATW (2014)
Guilherme S. Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez
Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. LATW (2012)