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The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory.

Evaldo Carlos Fonseca PereiraOdair Lelis GoncalezRafael Galhardo VazClaudio Antonio FedericoThiago Hanna BothGilson Inácio Wirth
Published in: LATW (2014)
Keyphrases
  • cross section
  • cross sections
  • random access memory
  • cross sectional
  • dynamic random access memory
  • power consumption
  • data transmission
  • main memory
  • memory requirements
  • macroblock