Thiago Hanna Both

Publication Activity (10 Years)

Years Active: 2012-2020
Publications (10 Years): 3

Top Topics

Random Access Memory

Power Consumption

Top Venues

Microelectron. Reliab.

J. Electron. Test.

Publications

Pablo Ilha Vaz, Gilson I. Wirth, Fábio Fedrizzi Vidor, Thiago Hanna Both
TID effects on I-V characteristics of bulk CMOS STD and ELT-based devices in 600 nm. Microelectron. J. 97 (2020)
Pablo Ilha Vaz, Thiago Hanna Both, Fábio Fedrizzi Vidor, Raphael Martins Brum, Gilson I. Wirth
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library. J. Electron. Test. 34 (6) (2018)
Thiago Hanna Both, Gabriela Firpo Furtado, Gilson Inácio Wirth
Modeling and simulation of the charge trapping component of BTI and RTS. Microelectron. Reliab. 80 (2018)
Evaldo Carlos Fonseca Pereira, Odair Lelis Goncalez, Rafael Galhardo Vaz, Claudio Antonio Federico, Thiago Hanna Both, Gilson Inácio Wirth
The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory. LATW (2014)
Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs. Microelectron. Reliab. 54 (9-10) (2014)
Fernanda Lima Kastensmidt, Jorge L. Tonfat, Thiago Hanna Both, Paolo Rech, Gilson I. Wirth, Ricardo Reis, Florent Bruguier, Pascal Benoit, Lionel Torres, Christopher Frost
Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs. ETS (2014)
Ricardo Vanni Dallasen, Gilson Inácio Wirth, Thiago Hanna Both
A PLL for clock generation with automatic frequency control under TID effects. SBCCI (2012)