Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs.
Fernanda Lima KastensmidtJorge L. TonfatThiago Hanna BothPaolo RechGilson I. WirthRicardo ReisFlorent BruguierPascal BenoitLionel TorresChristopher FrostPublished in: ETS (2014)
Keyphrases
- error rate
- low voltage
- test set
- power consumption
- power system
- data transmission
- lower error rates
- misclassification rate
- low power
- random access memory
- correct recognition rate
- word error rate
- cost sensitive classification
- electric field
- rule sets
- low cost
- design considerations
- equal error rate
- hardware implementation
- recognition rate
- image processing
- computer vision