RECOGNITION RATE
Experts
- Ching Y. Suen
- Shiguang Shan
- Anil K. Jain
- Stan Z. Li
- Rama Chellappa
- Xilin Chen
- Christoph Busch
- Björn W. Schuller
- Kevin W. Bowyer
- Mayank Vatsa
- Richa Singh
- Umapada Pal
- Naser Damer
- Gerhard Rigoll
- Weihong Deng
- Robert Sabourin
- Masaki Nakagawa
- Wen Gao
- Mita Nasipuri
- Jian Yang
- Cheng-Lin Liu
- Sébastien Marcel
- Xiaoou Tang
- David Zhang
- Arjan Kuijper
- P. Jonathon Phillips
- Zhen Lei
- Nasser M. Nasrabadi
- Haizhou Li
- Yunhong Wang
- Guodong Guo
- Josef Kittler
- Ran He
- Jean-Luc Dugelay
- Seong-Whan Lee
- Marios Savvides
- Florian Kirchbuchner
- Fumitaka Kimura
- Sargur N. Srihari
Venues
- CoRR
- ICASSP
- IEEE Access
- ICDAR
- Pattern Recognit.
- Sensors
- INTERSPEECH
- ICPR
- CVPR
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Neurocomputing
- CVPR Workshops
- FG
- IJCNN
- Expert Syst. Appl.
- Int. J. Pattern Recognit. Artif. Intell.
- ICCV
- SMC
- AAAI
- IROS
- ACM Multimedia
- EMBC
- Image Vis. Comput.
- CogSci
- WACV
- IEEE Trans. Image Process.
- Neural Comput. Appl.
- Remote. Sens.
- ICB
- NeuroImage
- IEEE Trans. Inf. Forensics Secur.
- ICRA
- Comput. Electron. Agric.
- ICME
- IJCB
- ICFHR
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