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Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects.
Lucas A. Tambara
Jorge L. Tonfat
Ricardo Reis
Fernanda Lima Kastensmidt
Evaldo Carlos Fonseca Pereira
Rafael Galhardo Vaz
Odair Lelis Goncalez
Published in:
LATW (2014)
Keyphrases
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error rate
test set
misclassification rate
lower error rates
rule sets
machine learning
information retrieval
training data
pattern recognition
hidden markov models
power consumption
cost sensitive classification
word error rate