Marcelo Soares Lubaszewski

Publication Activity (10 Years)

Years Active: 2000-2023
Publications (10 Years): 2

Top Topics

Vlsi Architecture

Wide Dynamic Range

Digital Signal Processing

Top Venues

Microelectron. Reliab.

Publications

Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen
Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. SBCCI (2023)
Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen
Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. LATS (2022)
Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt, Marcelo Soares Lubaszewski, Tiago R. Balen
Exploring design diversity redundancy to improve resilience in mixed-signal systems. Microelectron. Reliab. 55 (12) (2015)
Alfredo Olmos, Juan Pablo Martinez Brito, Fabrício Jorge Antunes Ferreira, Fernando Chávez, Marcelo Soares Lubaszewski
A 2-Transistor Sub-1V Low Power Temperature Compensated CMOS Voltage Reference. SBCCI (2014)
Alexandre M. Amory, Matheus T. Moreira, Ney Laert Vilar Calazans, Fernando Gehm Moraes, Cristiano Lazzari, Marcelo Soares Lubaszewski
Evaluating the scalability of test buses. ISSoC (2013)
Guilherme S. Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez
Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. LATW (2012)
Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski
Investigating the effects of transient faults in Programmable Capacitor Arrays. LATW (2011)
José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski
Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method. LATW (2000)
José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho
Fault Models and Compact Test Vectors for MOS OpAmp circuits. SBCCI (2000)