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Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool.

Lucas B. ZilchÁllan G. FerreiraMarcelo Soares LubaszewskiTiago R. Balen
Published in: LATS (2022)
Keyphrases
  • low cost
  • real time
  • neural network
  • data sets
  • real world
  • data mining
  • computer vision
  • image segmentation
  • high level
  • evolutionary algorithm
  • low power
  • single chip
  • analog circuits