José Vicente Calvano

Publication Activity (10 Years)

Years Active: 2000-2007
Publications (10 Years): 0

Publications

Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. 23 (6) (2007)
Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho
Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits CoRR (2007)
Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell
Functional Test of Field Programmable Analog Arrays. VTS (2006)
C. E. F. Savioli, C. E. C. Szendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho
Using Swarm Intelligence to Solve Some Analog Test Issues. LATW (2006)
Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho
Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits. DATE (2005)
Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho
ATPG for fault diagnosis on analog electrical networks using evolutionary techniques. SBCCI (2004)
José Vicente Calvano, Marcelo Lubaszewski
Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. IWSOC (2003)
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho
Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order. LATW (2002)
José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski
Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. VTS (2002)
José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski, Vladimir Castro Alves
State Model Approach for Analog Fault Modeling. LATW (2002)
José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski
Filter Sensitivity Analysis Using the TRAM. LATW (2001)
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho
Designing Testable Networks for Transfer Function Realization. LATW (2001)
José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski
Fault Models and Test Generation for OpAmp Circuits - The FFM. J. Electron. Test. 17 (2) (2001)
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. Asian Test Symposium (2000)
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski
Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. VTS (2000)
José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski
Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method. LATW (2000)
José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho
Fault Models and Compact Test Vectors for MOS OpAmp circuits. SBCCI (2000)
José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski
The Use of Macromodels on Op-Amp Circuits Fault Modeling. LATW (2000)