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Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus.
José Vicente Calvano
Vladimir Castro Alves
Antonio Carneiro de Mesquita Filho
Marcelo Lubaszewski
Published in:
VTS (2002)
Keyphrases
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mixed signal
high speed
low power
test data generation
vlsi circuits
edge detection
real time
image processing
power system
hardware and software
ieee bus