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Fault Models and Test Generation for OpAmp Circuits - The FFM.
José Vicente Calvano
Antonio Carneiro de Mesquita Filho
Vladimir Castro Alves
Marcelo Lubaszewski
Published in:
J. Electron. Test. (2001)
Keyphrases
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fault models
test generation
model based diagnosis
fault management
test cases
horn clauses
conflict resolution
fault model
static analysis
quality assurance
software testing
database
information systems
relational databases
fault tolerance