Login / Signup

Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits.

Állan G. FerreiraLucas B. ZilchVinícius NavarroMarcelo Soares LubaszewskiTiago R. Balen
Published in: SBCCI (2023)
Keyphrases
  • machine learning
  • error rate
  • test cases
  • test generation
  • real time
  • learning algorithm
  • computer vision
  • data model
  • low cost