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Using built-in sensors to cope with long duration transient faults in future technologies.

Carlos Arthur Lang LisbôaFernanda Lima KastensmidtEgas Henes NetoGilson I. WirthLuigi Carro
Published in: ITC (2007)
Keyphrases
  • long duration
  • transaction model
  • sensor networks
  • fault diagnosis
  • data mining
  • sensor data
  • data structure