Egas Henes Neto

Publication Activity (10 Years)

Years Active: 2005-2008
Publications (10 Years): 0

Publications

Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt
Modeling the sensitivity of CMOS circuits to radiation induced single event transients. Microelectron. Reliab. 48 (1) (2008)
Egas Henes Neto, Gilson I. Wirth, Fernanda Lima Kastensmidt
Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors. J. Electron. Test. 24 (5) (2008)
Carlos Arthur Lang Lisbôa, Fernanda Lima Kastensmidt, Egas Henes Neto, Gilson I. Wirth, Luigi Carro
Using built-in sensors to cope with long duration transient faults in future technologies. ITC (2007)
Egas Henes Neto, Fernanda Lima Kastensmidt, Gilson I. Wirth
A built-in current sensor for high speed soft errors detection robust to process and temperature variations. SBCCI (2007)
Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt
Generation and Propagation of Single Event Transients in CMOS Circuits. DDECS (2006)
Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt
Using Bulk Built-in Current Sensors to Detect Soft Errors. IEEE Micro 26 (5) (2006)
Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt
Single event transients in combinatorial circuits. SBCCI (2005)
Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt
Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. SBCCI (2005)