Philippe Roussel

Publication Activity (10 Years)

Years Active: 1984-2024
Publications (10 Years): 21

Top Topics

Top Venues

Microelectron. Reliab.

Publications

O. Varela Pedreira, Youqi Ding, D. Coenen, Philippe Roussel, A. S. Saleh, Veerle Simons, Houman Zahedmanesh, Ivan Ciofi, Kris Croes
De-Coupling Thermo-Migration from Electromigration Using a Dedicated Test Structure. IRPS (2024)
Y. Fang, Alicja Lesniewska, Ivan Ciofi, Philippe Roussel, Chen Wu, Victor Vega-Gonzalez, Ingrid De Wolf, Kris Croes
BEOL tip-to-tip dielectric reliability characterization using a design-representative test structure. IRPS (2024)
Md Nur K. Alam, Sergiu Clima, Ben Kaczer, Philippe Roussel, Brecht Truijen, Lars-Åke Ragnarsson, N. Horiguchi, Marc M. Heyns, Jan Van Houdt
Transition-state-theory-based interpretation of Landau double well potential for ferroelectrics. CoRR (2024)
Houman Zahedmanesh, Philippe Roussel, Ivan Ciofi, Kristof Croes
A pragmatic network-aware paradigm for system-level electromigration predictions at scale. IRPS (2023)
Md Nur K. Alam, Yusuke Higashi, Brecht Truijen, Ben Kaczer, Mihaela Ioana Popovici, Bj O'Sullivan, Philippe Roussel, Robin Degraeve, Marc M. Heyns, Jan Van Houdt
Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements. VLSI Technology and Circuits (2022)
Artemisia Tsiara, Alicja Lesniewska, Philippe Roussel, Srinivasan Ashwyn Srinivasan, Mathias Berciano, Marko Simicic, Marianna Pantouvaki, Joris Van Campenhout, Kristof Croes
Degradation mechanisms in Germanium Electro-Absorption Modulators. IRPS (2022)
Kristof Croes, Veerle Simons, Brecht Truijen, Philippe Roussel, Koen Van Sever, Artemisia Tsiara, Jacopo Franco, Philippe Absil
Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors. OFC (2022)
Brecht Truijen, Barry J. O'Sullivan, Md. Nurul Alam, Dieter Claes, M. Thesberg, Philippe Roussel, Adrian Chasin, Geert Van den Bosch, Ben Kaczer, Jan Van Houdt
Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks. IRPS (2022)
Andrea Vici, Robin Degraeve, João Pedro Bastos, Philippe Roussel, Ingrid De Wolf
Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks. IRPS (2022)
Zhicheng Wu, Jacopo Franco, Brecht Truijen, Philippe Roussel, Stanislav Tyaginov, Michiel Vandemaele, Erik Bury, Guido Groeseneken, Dimitri Linten, Ben Kaczer
Physics-based device aging modelling framework for accurate circuit reliability assessment. IRPS (2021)
Geert Hellings, Philippe Roussel, Nian Wang, Roman Boschke, Shih-Hung Chen, Marko Simicic, Mirko Scholz, Soeren Stoedel, Kris Myny, Dimitri Linten, Paul Hellings, Nowab Reza M. D. Ashif
Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP. IRPS (2019)
Marco Simicic, Pieter Weckx, Bertrand Parvais, Philippe Roussel, Ben Kaczer, Georges G. E. Gielen
Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations. IEEE Trans. Very Large Scale Integr. Syst. 27 (3) (2019)
Alexander Makarov, Dimitri Linten, Stanislav Tyaginov, Ben Kaczer, Philippe Roussel, Adrian Chasin, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Markus Jech, Tibor Grasser
Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. ESSDERC (2019)
Alexander Makarov, Ben Kaczer, Philippe Roussel, Adrian Chasin, Alexander Grill, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov
Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. IRPS (2019)
Jonas Doevenspeck, Robin Degraeve, Stefan Cosemans, Philippe Roussel, Bram-Ernst Verhoef, Rudy Lauwereins, Wim Dehaene
Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications. ESSDERC (2018)
Simon Van Beek, Philippe Roussel, Barry J. O'Sullivan, Robin Degraeve, Stefan Cosemans, Dimitri Linten, Gouri Sankar Kar
Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit. ESSDERC (2018)
Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Vamsi Putcha, Erik Bury, Marco Simicic, Adrian Chasin, Dimitri Linten, Bertrand Parvais, Francky Catthoor, Gerhard Rzepa, Michael Waltl, Tibor Grasser
A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. Microelectron. Reliab. 81 (2018)
Deniz Kocaay, Philippe Roussel, Kristof Croes, Ivan Ciofi, Alicja Lesniewska, Ingrid De Wolf
Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing. IRPS (2018)
Gerhard Rzepa, Jacopo Franco, Barry J. O'Sullivan, A. Subirats, Marco Simicic, Geert Hellings, Pieter Weckx, Markus Jech, Theresia Knobloch, Michael Waltl, Philippe Roussel, Dimitri Linten, Ben Kaczer, Tibor Grasser
Comphy - A compact-physics framework for unified modeling of BTI. Microelectron. Reliab. 85 (2018)
Deniz Kocaay, Philippe Roussel, Kris Croes, Ivan Ciofi, Y. Saad, Ingrid De Wolf
LER and spacing variability on BEOL TDDB using E-field mapping: Impact of field acceleration. Microelectron. Reliab. (2017)
Dimitrios Rodopoulos, Philippe Roussel, Francky Catthoor, Yiannakis Sazeides, Dimitrios Soudris
Approximating Standard Cell Delay Distributions by Reformulating the Most Probable Failure Point. ERMAVSS@DATE (2016)
Simon Van Beek, Koen Martens, Philippe Roussel, Gabriele Luca Donadio, Johan Swerts, Sofie Mertens, Gouri Sankar Kar, Tai Min, Guido Groeseneken
Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. IRPS (2015)
Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser
The defect-centric perspective of device and circuit reliability - From individual defects to circuits. ESSDERC (2015)
Abhitosh Vais, Koen Martens, Jacopo Franco, Dennis Lin, AliReza Alian, Philippe Roussel, S. Sioncke, Nadine Collaert, Aaron Thean, Marc M. Heyns, Guido Groeseneken, Kristin De Meyer
The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices. IRPS (2015)
Trong Huynh Bao, Dmitry Yakimets, Julien Ryckaert, Ivan Ciofi, Rogier Baert, Anabela Veloso, Jürgen Bömmels, Nadine Collaert, Philippe Roussel, S. Demuynck, Praveen Raghavan, Abdelkarim Mercha, Zsolt Tokei, Diederik Verkest, Aaron Thean, Piet Wambacq
Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies. ESSDERC (2014)
Maria Toledano-Luque, Ben Kaczer, Jacopo Franco, Philippe Roussel, Tibor Grasser, Guido Groeseneken
Defect-centric perspective of time-dependent BTI variability. Microelectron. Reliab. 52 (9-10) (2012)
Miguel Miranda, Philippe Roussel, Lucas Brusamarello, Gilson I. Wirth
Statistical characterization of standard cells using design of experiments with response surface modeling. DAC (2011)
Lucas Brusamarello, Gilson I. Wirth, Philippe Roussel, Miguel Miranda
Fast and accurate statistical characterization of standard cell libraries. Microelectron. Reliab. 51 (12) (2011)
Miguel Miranda, Paul Zuber, Petr Dobrovolný, Philippe Roussel
Variability aware modeling for yield enhancement of SRAM and logic. DATE (2011)
Jouke Verbree, Erik Jan Marinissen, Philippe Roussel, Dimitrios Velenis
On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking. ETS (2010)
Amadou Ndiaye, Guy Della Valle, Philippe Roussel
Qualitative modelling of a multi-step process: The case of French breadmaking. Expert Syst. Appl. 36 (2) (2009)
Paul Zuber, Vladimir Matvejev, Philippe Roussel, Petr Dobrovolný, Miguel Miranda
Exponent Monte Carlo for Quick Statistical Circuit Simulation. PATMOS (2009)
Miguel Miranda, Bart Dierickx, Paul Zuber, Petr Dobrovolný, F. Kutscherauer, Philippe Roussel, Pavel Poliakov
Variability aware modeling of SoCs: From device variations to manufactured system yield. ISQED (2009)
Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt
gate stacks. Microelectron. Reliab. 47 (4-5) (2007)
Ben Kaczer, Robin Degraeve, Philippe Roussel, Guido Groeseneken
Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability. Microelectron. Reliab. 47 (4-5) (2007)
David Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken
Transient voltage overshoot in TLP testing - Real or artifact? Microelectron. Reliab. 47 (7) (2007)
Antonis Papanikolaou, T. Grabner, Miguel Miranda, Philippe Roussel, Francky Catthoor
Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations. CODES+ISSS (2006)
Jocelyne Husson van Vliet, Philippe Roussel
Estimation des titres viraux : une programmation pratique et fiable sur calculatrice de poche, et accessible par l'Internet. Monde des Util. Anal. Données 34 (2006)
Y.-L. Li, Zsolt Tokei, Philippe Roussel, Guido Groeseneken, Karen Maex
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectron. Reliab. 45 (9-11) (2005)
Alain Colmerauer, Philippe Roussel
The Birth of Prolog. HOPL Preprints (1993)
Maria-Virginia Aponte, José Alberto Fernández, Philippe Roussel
Editing First-Order Proofs: Programmed Rules vs Derived Rules. SLP (1984)