Y. Saad

Publication Activity (10 Years)

Years Active: 2015-2017
Publications (10 Years): 1

Top Topics

Software Reliability

Top Venues

Microelectron. Reliab.

Publications

Deniz Kocaay, Philippe Roussel, Kris Croes, Ivan Ciofi, Y. Saad, Ingrid De Wolf
LER and spacing variability on BEOL TDDB using E-field mapping: Impact of field acceleration. Microelectron. Reliab. (2017)
Kris Croes, Alicja Lesniewska, Chen Wu, Ivan Ciofi, Agnieszka Banczerowska, B. Briggs, S. Demuynck, Zsolt Tokei, Jürgen Bömmels, Y. Saad, W. Gao
Intrinsic reliability of local interconnects for N7 and beyond. IRPS (2015)