Alicja Lesniewska

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 12

Top Topics

Reliability Assessment

Top Venues

VLSI Technology and Circuits

Publications

D. Tiernc, Antonio Arreghini, Alicja Lesniewska, Y. Jeong, Marleen H. van der Veen, J. Stiers, N. Bazzazian, Ivan Ciofi, Geert Van den Bosch, Maarten Rosmeulen
Exploring the Reliability Limits for the Z-Pitch Scaling of Molybdenum Inter-Word Line Oxides in 3D NAND. IRPS (2024)
Y. Fang, Alicja Lesniewska, Ivan Ciofi, Philippe Roussel, Chen Wu, Victor Vega-Gonzalez, Ingrid De Wolf, Kris Croes
BEOL tip-to-tip dielectric reliability characterization using a design-representative test structure. IRPS (2024)
Melina Lofrano, Herman Oprins, Xinyue Chang, Bjorn Vermeersch, Olalla Varela Pedreira, Alicja Lesniewska, Vladimir Cherman, Ivan Ciofi, Kristof Croes, Seongho Park, Zsolt Tokei
Towards accurate temperature prediction in BEOL for reliability assessment (Invited). IRPS (2023)
Artemisia Tsiara, Alicja Lesniewska, Philippe Roussel, Srinivasan Ashwyn Srinivasan, Mathias Berciano, Marko Simicic, Marianna Pantouvaki, Joris Van Campenhout, Kristof Croes
Degradation mechanisms in Germanium Electro-Absorption Modulators. IRPS (2022)
Gayle Murdoch, M. O'Toole, G. Marti, A. Pokhrel, D. Tsvetanova, S. Decoster, S. Kundu, Y. Oniki, A. Thiam, Q. T. Le, O. Varela Pedreira, Alicja Lesniewska, G. Martinez-Alanis, S. Park, Zsolt Tokei
First demonstration of Two Metal Level Semi-damascene Interconnects with Fully Self-aligned Vias at 18MP. VLSI Technology and Circuits (2022)
Alicja Lesniewska, Olalla Varela Pedreira, Melina Lofrano, Gayle Murdoch, Marleen H. van der Veen, Anish Dangol, Naoto Horiguchi, Zsolt Tokei, Kris Croes
Reliability of a DME Ru Semidamascene scheme with 16 nm wide Airgaps. IRPS (2021)
Alicja Lesniewska, Philippe J. Roussel, Davide Tierno, Victor Vega-Gonzalez, Marleen H. van der Veen, Patrick Verdonck, Nicolas Jourdan, Christopher J. Wilson, Zsolt Tokei, Kris Croes
Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill. IRPS (2020)
Chen Wu, Adrian Chasin, Andrea Padovani, Alicja Lesniewska, Steven Demuynck, Kris Croes
Role of Defects in the Reliability of HfO2/Si-Based Spacer Dielectric Stacks for Local Interconnects. IRPS (2019)
Alicja Lesniewska, S. A. Srinivasan, Joris Van Campenhout, Barry J. O'Sullivan, Kris Croes
Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors. IRPS (2019)
Joris Van Campenhout, Yoojin Ban, Peter De Heyn, Ashwyn Srinivasan, Jeroen De Coster, Sebastien Lardenois, Brad Snyder, Sadhishkumar Balakrishnan, Guy Lepage, Negin Golshani, Sofie Janssen, Alicja Lesniewska, Kristof Croes, Andy Miller, Peter Verheyen, Marianna Pantouvaki, Philippe Absil
Silicon Photonics for 56G NRZ Optical Interconnects. OFC (2018)
Deniz Kocaay, Philippe Roussel, Kristof Croes, Ivan Ciofi, Alicja Lesniewska, Ingrid De Wolf
Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing. IRPS (2018)
Chen Wu, O. Varela Pedreira, Alicja Lesniewska, Yunlong Li, Ivan Ciofi, Zsolt Tokei, Kris Croes
Insights into metal drift induced failure in MOL and BEOL. IRPS (2018)
Kris Croes, Alicja Lesniewska, Chen Wu, Ivan Ciofi, Agnieszka Banczerowska, B. Briggs, S. Demuynck, Zsolt Tokei, Jürgen Bömmels, Y. Saad, W. Gao
Intrinsic reliability of local interconnects for N7 and beyond. IRPS (2015)