Victor Vega-Gonzalez

Publication Activity (10 Years)

Years Active: 2013-2024
Publications (10 Years): 4

Top Topics

Reliability Analysis

Simulation Study

Mechanisms Underlying

Top Venues

VLSI Technology and Circuits

Publications

Y. Fang, Alicja Lesniewska, Ivan Ciofi, Philippe Roussel, Chen Wu, Victor Vega-Gonzalez, Ingrid De Wolf, Kris Croes
BEOL tip-to-tip dielectric reliability characterization using a design-representative test structure. IRPS (2024)
Victor Vega-Gonzalez, D. Radisic, Bt Chan, S. Choudhury, S. Wang, A. Mingardi, Q. Toan Le, H. Decoster, Y. Oniki, P. Puttarame, Kevin Vandersmissen, J. P. Soulie, A. Peter, A. Sepulveda, D. Batuk, G. T. Martinez, Olivier Richard, Jürgen Bömmels, S. Biesemans, E. Dentoni Litta, Naoto Horiguchi, S. Park, Zsolt Tokei
Integration of a Stacked Contact MOL for Monolithic CFET. VLSI Technology and Circuits (2023)
Alicja Lesniewska, Philippe J. Roussel, Davide Tierno, Victor Vega-Gonzalez, Marleen H. van der Veen, Patrick Verdonck, Nicolas Jourdan, Christopher J. Wilson, Zsolt Tokei, Kris Croes
Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill. IRPS (2020)
Olalla Varela Pedreira, Michele Stucchi, Anshul Gupta, Victor Vega-Gonzalez, Marleen van der Veen, Stephane Lariviere, Christopher J. Wilson, Zsolt Tokei, Kristof Croes
Metal reliability mechanisms in Ruthenium interconnects. IRPS (2020)
Victor Vega-Gonzalez, Edmundo Gutierrez-Dominguez, Fernando Guarin
A negative differential resistance effect implemented with a single MOSFET from 375 k down to 80 k. ESSDERC (2013)