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Metal reliability mechanisms in Ruthenium interconnects.

Olalla Varela PedreiraMichele StucchiAnshul GuptaVictor Vega-GonzalezMarleen van der VeenStephane LariviereChristopher J. WilsonZsolt TokeiKristof Croes
Published in: IRPS (2020)
Keyphrases
  • input output
  • mechanism design
  • mechanisms underlying
  • information retrieval
  • neural network
  • database systems
  • building blocks
  • failure rate
  • highly reliable
  • reliability analysis