Fernando Guarin

Publication Activity (10 Years)

Years Active: 2013-2023
Publications (10 Years): 16

Top Topics

Innovative Approaches

Reliability Analysis

Quantum Computing

Top Venues

Publications

Dora A. Chaparro-Ortiz, Alan Y. Otero-Carrascal, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Guevara, P. Srinivasan, Fernando Guarin
Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET. IRPS (2023)
P. Srinivasan, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. IRPS (2023)
Aarti Rathi, Abhisek Dixit, Naga Satish, P. Srinivasan, Fernando Guarin
Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications. IRPS (2023)
Aarti Rathi, Abhisek Dixit, P. Srinivasan, Oscar H. Gonzalez, Fernando Guarin
RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications. IRPS (2022)
Ned Cahoon, P. Srinivasan, Fernando Guarin
6G Roadmap for Semiconductor Technologies: Challenges and Advances. IRPS (2022)
P. Srinivasan, Fernando Guarin, Enkhbayasgalan Gantsog, Harish Krishnaswamy, Arun Natarajan
Excellent RF Product HTOL reliability of 5G mmWave beamformer chip fabricated using GF 45RFSOI technologies. IRPS (2022)
M. Hauser, P. Srinivasan, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min
Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. IRPS (2022)
Asifa Amin, Aarti Rathi, Sujit K. Singh, Abhisek Dixit, Oscar H. Gonzalez, P. Srinivasan, Fernando Guarin
Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications. IRPS (2022)
P. Srinivasan, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. IRPS (2021)
Aarti Rathi, P. Srinivasan, Fernando Guarin, Abhisek Dixit
Large Signal RF Reliability of 45-nm RFSOI Power Amplifier Cell for Wi-Fi6 Applications. IRPS (2021)
P. Srinivasan, Fernando Guarin
CMOS RF reliability for 5G mmWave applications - Challenges and Opportunities. IRPS (2021)
Paul Colestock, P. Srinivasan, Fernando Guarin
Silicon Based RF Reliability Challenges for 5G Communications. IRPS (2020)
Peter C. Paliwoda, Mohamed A. Rabie, Oscar D. Restrepo, Eduardo Cruz Silva, E. Kaltalioglu, Fernando Guarin, Kenneth Barnett, Jeffrey Johnson, William Taylor, Myra Boenke, Byoung Min
Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications. IRPS (2020)
P. Srinivasan, Paul Colestock, Thomas Samuels, Stephen Moss, Fernando Guarin, Byoung Min
A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. IRPS (2020)
Wen Liu, Andreas Kerber, Fernando Guarin, Claude Ortolland
Cap layer and multi-work-function tuning impact on TDDB/BTI in SOI FinFET devices. IRPS (2018)
Steven W. Mittl, Fernando Guarin
Self-heating and its implications on hot carrier reliability evaluations. IRPS (2015)
A. Erika Pondigo de los, Edmundo A. Gutierrez-D, Joel Molina Reyes, Fernando Guarin
Non-homogeneous space mechanical strain induces asymmetrical magneto-tunneling conductance in MOSFETs. ESSDERC (2014)
Victor Vega-Gonzalez, Edmundo Gutierrez-Dominguez, Fernando Guarin
A negative differential resistance effect implemented with a single MOSFET from 375 k down to 80 k. ESSDERC (2013)