Byoung Min

Publication Activity (10 Years)

Years Active: 2006-2023
Publications (10 Years): 9

Top Topics

Reliability Analysis

Silicon Dioxide

Top Venues

Publications

P. Srinivasan, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. IRPS (2023)
Wen Liu, Dimitris P. Ioannou, Johnatan Kantarovsky, Byoung Min, Tanya Nigam
Robust Off-State TDDB Reliability of n-LDMOS. IRPS (2022)
M. Hauser, P. Srinivasan, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min
Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. IRPS (2022)
P. Srinivasan, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. IRPS (2021)
Maria Toledano-Luque, Peter C. Paliwoda, Mohamed Nour, Thomas Kauerauf, Byoung Min, Germain Bossu, Mahesh Siddabathula, Tanya Nigam
Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. IRPS (2021)
Peter C. Paliwoda, Mohamed A. Rabie, Oscar D. Restrepo, Eduardo Cruz Silva, E. Kaltalioglu, Fernando Guarin, Kenneth Barnett, Jeffrey Johnson, William Taylor, Myra Boenke, Byoung Min
Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications. IRPS (2020)
P. Srinivasan, Paul Colestock, Thomas Samuels, Stephen Moss, Fernando Guarin, Byoung Min
A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. IRPS (2020)
Stewart Rauch, Dongho Lee, Alexey Vert, Lin Jiang, Byoung Min
Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics. OFC (2020)
M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, J. Johnson, P. Srinivasan, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. IRPS (2019)
Héctor Sánchez, Bill Johnstone, Doug Roberts, Om Mandhana, Brad Melnick, Muhsin Celik, Mike Baker, Jim Hayden, Byoung Min, John Edgerton, Bruce White
Increasing Microprocessor Speed by Massive Application of On-Die High-K MIM Decoupling Capacitors. ISSCC (2006)